Անվանում:

Infrared Image Processing Algorithm for Solar Cell Defect Assessment

Հեղինակ:

Hovhannisyan A.

Տեսակ:

Conference

Համահեղինակ(ներ):

Petrosyan A.

Չվերահսկվող բանալի բառեր:

Defects ; Qualification and Testing ; Solar Cell ; Electroluminescence

Ամփոփում:

The detection and assessment of solar cell defects are highly important during the development, production and usage of photovoltaic modules. Solar cell defects can be detected by different methods including electroluminescence, photoluminescence and thermography. In this paper, the algorithm for solar cell defect assessment by infrared image processing is proposed. The algorithm is based on comparison of infrared images of testing cell and the sample of high quality solar cell. For the algorithm realization, the NI LabVIEW and NI Vision Assistant applications are used. The suggested method of defects assessment allows to realize the solar cell infrared image processing automatically with the high definition.

ISBN:

3-936338-47-7

Լեզու:

English

URL:


Երկիր:

Netherlands

Տարի:

2017

Ժամանակահատված:

25 - 29 September

Գիտաժողովի անվանում:

33rd European Photovoltaic Solar Energy Conference and Exhibition

Վայր:

Amsterdam

Մասնակցության տեսակը:

poster