Object

Title: Fault collapsing for digital circuits based on relations between stuck-at faults

Co-author(s) :

Malkhasyan Heghineh ; Mushyan Gevorg ; Vardanian Valery

Abstract:

A way for fault collapsing is proposed for digital circuits based on the relations of fault equivalence and fault dominance. A new notion of strict structural fault dominance is proposed for single stuck-at faults on input/output lines of logical gates. Experiments are conducted on combinational circuits of ISCAS'85 and combinational parts of sequential benchmark circuits of ISCAS'89 benchmark circuits. Fault collapsing for most of the circuits is about 60-70%.

Publisher:

IEEE

Identifier:

oai:noad.sci.am:136144

DOI:

10.1109/CSITechnol.2015.7358242

ISBN:

978-1-4673-7562-7

Language:

English

Volume:

1

URL:


Affiliation:

Yerevan State University ; Educational & Research Center of Informational Technologies

Country:

Armenia

Year:

2015

Time period:

28 Sept.-2 Oct.

Conference title:

CSIT 2015 Revised Selected Papers, IEEE conference proceedings

Place:

Yerevan

Object collections:

Last modified:

Apr 19, 2021

In our library since:

Apr 19, 2021

Number of object content hits:

6

All available object's versions:

https://noad.sci.am/publication/149680

Show description in RDF format:

RDF

Show description in OAI-PMH format:

OAI-PMH

This page uses 'cookies'. More information